Lämmle B, Schmalz K, Scheytt C, Kissinger D, Weigel R (2011)
Publication Type: Conference contribution
Publication year: 2011
Pages Range: 1-4
Conference Proceedings Title: IEEE Compound Semiconductor Integrated Circuits Symposium
Event location: Waikoloa, HI
APA:
Lämmle, B., Schmalz, K., Scheytt, C., Kissinger, D., & Weigel, R. (2011). A 122 GHz multiprobe reflectometer for dielectric sensor readout in SiGe BiCMOS technology. In IEEE Compound Semiconductor Integrated Circuits Symposium (pp. 1-4). Waikoloa, HI.
MLA:
Lämmle, Benjamin, et al. "A 122 GHz multiprobe reflectometer for dielectric sensor readout in SiGe BiCMOS technology." Proceedings of the IEEE Compound Semiconductor Integrated Circuits Symposium, Waikoloa, HI 2011. 1-4.
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