Gonser M, Keller C, Hansen J, Weigel R (2010)
Publication Type: Conference contribution
Publication year: 2010
Publisher: IEEE
Pages Range: 590-593
Conference Proceedings Title: Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), 2010
Event location: Beijing, China
DOI: 10.1109/APEMC.2010.5475696
This paper deals with modeling and simulation of cable bundles for automotive EMC tests. A new stochastic cable bundle model is presented. The parameters of the model are grouped into parameters for geometry, simulation, and disorder. Using a particularly developed cable bundle testbench, the model is validated against measurements and the parameter dependencies are investigated. The parameter study shows that the model is governed by one universal constant which describes the stochastics of the cable bundle and a characteristic density which is directly related to the cable bundle geometry. Finally, the model is used in an exemplary EMC setup whose device under test is a partially populated printed circuit board of an automotive electronic control unit. The simulation agrees very well with the according real life measurement setup.
APA:
Gonser, M., Keller, C., Hansen, J., & Weigel, R. (2010). Advanced simulations of automotive EMC measurement setups using stochastic cable bundle models. In Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), 2010 (pp. 590-593). Beijing, China: IEEE.
MLA:
Gonser, Markus, et al. "Advanced simulations of automotive EMC measurement setups using stochastic cable bundle models." Proceedings of the Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), 2010, Beijing, China IEEE, 2010. 590-593.
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