Lämmle B, Wagner C, Jäger H, Weigel R (2010)
Publication Type: Conference contribution
Publication year: 2010
Pages Range: 192-195
Conference Proceedings Title: Topical Meeting on Silicon Monolithic Integrated Systems in RF Systems
Event location: New Orleans, USA
ISBN: 978-1-4244-5456-3
The temperature behavior of a high speed direct digital synthesizer with a maximum clock frequency of 16.8 GHz and a power consumption of 488 mW at room temperature is investigated. The DDS has been manufactured in a 200-GHz ft SiGe bipolar technology and occupies a chip area of 1.15 mm2. A subsampling approach is introduced to analyze the output spectrum of the DDS. A calibration is performed over temperature to improve the spectral performance of the DDS. The calibration is based on a two point measurement and the use of a look-up table. After calibration, the third harmonic is below 53 dBc and a narrow band SFDR is nearly constant at 38 dBc.
APA:
Lämmle, B., Wagner, C., Jäger, H., & Weigel, R. (2010). Temperature Calibration of a Differential Pair based Direct Digital Synthesizer through Subsampling Spectral Analysis. In Topical Meeting on Silicon Monolithic Integrated Systems in RF Systems (pp. 192-195). New Orleans, USA.
MLA:
Lämmle, Benjamin, et al. "Temperature Calibration of a Differential Pair based Direct Digital Synthesizer through Subsampling Spectral Analysis." Proceedings of the Topical Meeting on Silicon Monolithic Integrated Systems in RF Systems, New Orleans, USA 2010. 192-195.
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