Weigel R, Wojnowski M, Engl M (2007)
Publication Type: Conference contribution
Publication year: 2007
Pages Range: 117-120
Conference Proceedings Title: IEEE Workshop on Signal Propagation on Interconnects
Event location: Genova, IT
ISBN: 978-1-4244-1224-2
For accurate RLCG-parameter extraction the measured S-parameter matrix needs to be converted to the Z-matrix. However, there exist three different definitions of S-parameters and consequently three different formulas of converting S-matrix into Z-matrix. In this article, we present an overview of existing S-parameters definitions and examine the uncertainties associated with the S-matrix to Z-matrix transformations. Further, we introduce an error estimator describing the inaccuracy one makes performing the incorrect transformation. We compare de-embedded measurement results of an inductor manufactured in Si-based MCM-D technology. We show that using wrong transformation can easily lead to erroneous or even catastrophic results.
APA:
Weigel, R., Wojnowski, M., & Engl, M. (2007). Considerations on Imedance Matrix Determination for Accurate Passive Device Chracterization. In IEEE Workshop on Signal Propagation on Interconnects (pp. 117-120). Genova, IT.
MLA:
Weigel, Robert, Maciej Wojnowski, and Mario Engl. "Considerations on Imedance Matrix Determination for Accurate Passive Device Chracterization." Proceedings of the IEEE Workshop on Signal Propagation on Interconnects, Genova, IT 2007. 117-120.
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