Optical and Microwave Length Measurement Techniques for Logs Proc. pf SPIE's 46th Annual Meeting

Stelzer A, Diskus C, Holzer R, Stadler M, Weigel R (2001)

Publication Type: Conference contribution

Publication year: 2001

Pages Range: 174-182

Conference Proceedings Title: International Conference on Subsurface Sensing Technology and Applications III

Event location: San Diego, CA, USA

Authors with CRIS profile

Robert Weigel Lehrstuhl für Technische Elektronik

Involved external institutions

Johannes Kepler Universität (JKU) Linz AT Austria (AT)

How to cite

APA:

Stelzer, A., Diskus, C., Holzer, R., Stadler, M., & Weigel, R. (2001). Optical and Microwave Length Measurement Techniques for Logs Proc. pf SPIE's 46th Annual Meeting. In International Conference on Subsurface Sensing Technology and Applications III (pp. 174-182). San Diego, CA, USA.

MLA:

Stelzer, Andreas, et al. "Optical and Microwave Length Measurement Techniques for Logs Proc. pf SPIE's 46th Annual Meeting." Proceedings of the International Conference on Subsurface Sensing Technology and Applications III, San Diego, CA, USA 2001. 174-182.

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