Johnson J, Weigel R (1995)
Publication Type: Conference contribution
Publication year: 1995
Book Volume: 2
Pages Range: 895-898
Conference Proceedings Title: International Microwave Symposium Digest
Event location: Orlando (Florida), USA
ISBN: 978-0-7803-2581-4
DOI: 10.1109/MWSYM.1995.405903
Efficient and cost effective testing is an important part of the production process of SAW components. One aspect of testing is the measurement of the device transfer characteristic. In many cases expensive test fixtures containing matching networks are required. In order to reduce production costs and facilitate the measurement of transfer functions without matching networks, a different approach has been taken. Through use of estimation methods one can reduce the amount of information required to calculate a matched transfer function. Therefore, we developed a method by which a simulated match could be performed, but required only knowledge of the unmatched and uncalibrated S21-parameter. The feasibility of our technique is demonstrated with a low loss IF SPUDT filter for mobile telephone applications
APA:
Johnson, J., & Weigel, R. (1995). An Efficient and Cost Effective SAW Device Measurement Method Based on an S-Parameter Estimation Technique. In International Microwave Symposium Digest (pp. 895-898). Orlando (Florida), USA.
MLA:
Johnson, John, and Robert Weigel. "An Efficient and Cost Effective SAW Device Measurement Method Based on an S-Parameter Estimation Technique." Proceedings of the International Microwave Symposium Digest, Orlando (Florida), USA 1995. 895-898.
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