Relative intensity noise (RIN) of near infrared DFB and VCSEL diode lasers under the influence of back reflections

Lins B, Engelbrecht R, Zinn P, Buchtal R, Schmauß B (2011)

Publication Type: Conference contribution

Publication year: 2011

Event location: Zermatt CH

Authors with CRIS profile

Rainer Engelbrecht Lehrstuhl für Hochfrequenztechnik Bernhard Schmauß Professur für Hochfrequenztechnik mit dem Schwerpunkt Optische Hochfrequenztechnik und Photonik

How to cite

APA:

Lins, B., Engelbrecht, R., Zinn, P., Buchtal, R., & Schmauß, B. (2011). Relative intensity noise (RIN) of near infrared DFB and VCSEL diode lasers under the influence of back reflections. In Proceedings of the 8th International Conference on Tunable Diode Laser Spectroscopy, TDLS 2011. Zermatt, CH.

MLA:

Lins, B., et al. "Relative intensity noise (RIN) of near infrared DFB and VCSEL diode lasers under the influence of back reflections." Proceedings of the 8th International Conference on Tunable Diode Laser Spectroscopy, TDLS 2011, Zermatt 2011.

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