Richter N, Hernandez YR, Schweitzer S, Kim JS, Patra AK, Englert J, Lieberwirth I, Liscio A, Palermo V, Feng X, Hirsch A, Muellen K, Klaeui M (2017)
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 2017
Publisher: American Physical Society
Book Volume: 7
Article Number: 024022
Journal Issue: 2
DOI: 10.1103/PhysRevApplied.7.024022
APA:
Richter, N., Hernandez, Y.R., Schweitzer, S., Kim, J.-S., Patra, A.K., Englert, J.,... Klaeui, M. (2017). Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene. Physical Review Applied, 7(2). https://doi.org/10.1103/PhysRevApplied.7.024022
MLA:
Richter, Nils, et al. "Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene." Physical Review Applied 7.2 (2017).
BibTeX: Download