Boubekeur H, Mikolajick T, Bauer A, Frey L, Ryssel H (2002)
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 2002
Book Volume: 303
Pages Range: 12-16
Journal Issue: 1
DOI: 10.1016/S0022-3093(02)00957-2
APA:
Boubekeur, H., Mikolajick, T., Bauer, A., Frey, L., & Ryssel, H. (2002). Effect of barium contamination on gate oxide integrity in high-k dram. Journal of Non-Crystalline Solids, 303(1), 12-16. https://doi.org/10.1016/S0022-3093(02)00957-2
MLA:
Boubekeur, H., et al. "Effect of barium contamination on gate oxide integrity in high-k dram." Journal of Non-Crystalline Solids 303.1 (2002): 12-16.
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