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Nano-slit probes for near-field optical microscopy fabricated by focused ion beams

Danzebrink H, Dziomba T, Sulzbach T, Ohlsson O, Lehrer C, Frey L (1999)

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Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 1999

Journal

Book Volume: 194

Pages Range: 335-339

DOI: 10.1046/j.1365-2818.1999.00505.x

Authors with CRIS profile

How to cite

APA:

Danzebrink, H., Dziomba, T., Sulzbach, T., Ohlsson, O., Lehrer, C., & Frey, L. (1999). Nano-slit probes for near-field optical microscopy fabricated by focused ion beams. Journal of Microscopy, 194, 335-339. https://doi.org/10.1046/j.1365-2818.1999.00505.x

MLA:

Danzebrink, H., et al. "Nano-slit probes for near-field optical microscopy fabricated by focused ion beams." Journal of Microscopy 194 (1999): 335-339.

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