Dziomba T, Sulzbach T, Ohlsson O, Lehrer C, Frey L, Danzebrink H (1999)
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 1999
Publisher: John Wiley & Sons Ltd
City/Town: Chichester, United Kingdom
Book Volume: 27
Pages Range: 486-490
Event location: Basel, Switz
Journal Issue: 5
URI: https://www.scopus.com/record/display.uri?eid=2-s2.0-0032643999&origin=inward
APA:
Dziomba, T., Sulzbach, T., Ohlsson, O., Lehrer, C., Frey, L., & Danzebrink, H. (1999). Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM). Surface and Interface Analysis, 27(5), 486-490.
MLA:
Dziomba, T., et al. "Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM)." Surface and Interface Analysis 27.5 (1999): 486-490.
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