Weiss R, Frey L, Ryssel H (2004)
Publication Status: Published
Publication Type: Authored book, Volume of book series
Publication year: 2004
Pages Range: 973-976
Event location: Lyon
URI: https://www.scopus.com/record/display.uri?eid=2-s2.0-8644276383&origin=inward
APA:
Weiss, R., Frey, L., & Ryssel, H. (2004). Modeling of the influence of Schottky barrier inhomogeneities on SiC diode characteristics.
MLA:
Weiss, Roland, Lothar Frey, and Heiner Ryssel. Modeling of the influence of Schottky barrier inhomogeneities on SiC diode characteristics. 2004.
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