Characterization of interface state densitiesby photocurrent analysis: Comparison of results for different insulator layers

Rommel M, Groß M, Ettinger A, Lemberger M, Bauer A, Frey L, Ryssel H (2005)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2005

Journal

Microelectronic Engineering Elsevier

Book Volume: 80

Pages Range: 50-53

DOI: 10.1016/j.mee.2005.04.042

Authors with CRIS profile

Lothar Frey Lehrstuhl für Elektronische Bauelemente Heiner Ryssel Technische Fakultät

Involved external institutions

Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB) DE Germany (DE)

How to cite

APA:

Rommel, M., Groß, M., Ettinger, A., Lemberger, M., Bauer, A., Frey, L., & Ryssel, H. (2005). Characterization of interface state densitiesby photocurrent analysis: Comparison of results for different insulator layers. Microelectronic Engineering, 80, 50-53. https://doi.org/10.1016/j.mee.2005.04.042

MLA:

Rommel, Matthias, et al. "Characterization of interface state densitiesby photocurrent analysis: Comparison of results for different insulator layers." Microelectronic Engineering 80 (2005): 50-53.

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