Analysis of a built-in test architecture for direct-conversion SiGe millimeter-wave receiver frontends

Kissinger D, Agethen R, Weigel R (2010)

Publication Type: Conference contribution

Publication year: 2010

Pages Range: 944-948

Conference Proceedings Title: IEEE Instrumentation and Measurement Technology Conference

Event location: Austin, TX

Authors with CRIS profile

Dietmar Kissinger Lehrstuhl für Technische Elektronik Roman Agethen Lehrstuhl für Technische Elektronik Robert Weigel Lehrstuhl für Technische Elektronik

How to cite

APA:

Kissinger, D., Agethen, R., & Weigel, R. (2010). Analysis of a built-in test architecture for direct-conversion SiGe millimeter-wave receiver frontends. In IEEE Instrumentation and Measurement Technology Conference (pp. 944-948). Austin, TX.

MLA:

Kissinger, Dietmar, Roman Agethen, and Robert Weigel. "Analysis of a built-in test architecture for direct-conversion SiGe millimeter-wave receiver frontends." Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Austin, TX 2010. 944-948.

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