Bandwidth Dependence of CW Ranging to UHF RFID Tags in Severe Multipath Environments

Li G, Arnitz D, Ebelt R, Muehlmann U, Witrisal K, Vossiek M (2011)

Publication Type: Conference contribution

Publication year: 2011

Event location: Orlando US

DOI: 10.1109/RFID.2011.5764631

Authors with CRIS profile

Martin Vossiek Lehrstuhl für Hochfrequenztechnik

Involved external institutions

NXP Semiconductors N.V. NL Netherlands (NL) Technische Universität Clausthal / Clausthal University of Technology DE Germany (DE) Technische Universität Graz AT Austria (AT)

How to cite

APA:

Li, G., Arnitz, D., Ebelt, R., Muehlmann, U., Witrisal, K., & Vossiek, M. (2011). Bandwidth Dependence of CW Ranging to UHF RFID Tags in Severe Multipath Environments. In Proceedings of the 5th Annual IEEE International Conference on RFID (IEEE RFID 2011). Orlando, US.

MLA:

Li, Gang, et al. "Bandwidth Dependence of CW Ranging to UHF RFID Tags in Severe Multipath Environments." Proceedings of the 5th Annual IEEE International Conference on RFID (IEEE RFID 2011), Orlando 2011.

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