El Melegy A, Hausotte T, Mohammed Abu EWY, Mohammed Ahmed A, Weinert B, Klöpzig U (2016)
Publication Language: English
Publication Type: Conference contribution, Conference Contribution
Publication year: 2016
Pages Range: 261-266
Conference Proceedings Title: IEEE IST 2016 Conference Proceeding
APA:
El Melegy, A., Hausotte, T., Mohammed Abu, E.-W.Y., Mohammed Ahmed, A., Weinert, B., & Klöpzig, U. (2016). Large Range Self-Sensing Atomic Force Microscope (LR-SAFM) for Surface Topography. In IEEE IST 2016 Conference Proceeding (pp. 261-266). Chania, Kreta, GR.
MLA:
El Melegy, Ahmed, et al. "Large Range Self-Sensing Atomic Force Microscope (LR-SAFM) for Surface Topography." Proceedings of the IEEE International Conference on Imaging Systems & Techniques, Chania, Kreta 2016. 261-266.
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