Daniel Breidenstein

Orcid ID:

0009-0000-6155-3432

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Professur für Elektromagnetische Felder Lehrstuhl für Optoelektronik
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Types of publications

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Journal

Cost-Effective Test Setup for Measuring Threshold Voltage Shift of GaN-HEMTs under Long-Term Drain-Voltage Stress (2023) Breidenstein D, Kohlhepp B, Dürbaum T Conference contribution, Conference Contribution
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