Armin Talai

Lehrstuhl für Technische Elektronik

An Accurate Free Space Method for Material Characterization in W-Band Using Material Samples with Two Different Thicknesses (2018) Lau I, Frank M, Shi K, Lurz F, Talai A, Weigel R, Kölpin A Conference contribution, Conference Contribution Porösizierte Glaskeramik-Substrate für die Radarsensorik (2018) Talai A, Kölpin A, Bittner A, Steinhäußer F, Schmid U, Kölpin A Book chapter / Article in edited volumes A Resonant Substrate Integrated Waveguide Measurement System for True Relative Permittivity Extraction of PCB Materials up to 90 GHz (2018) Lau I, Michler F, Talai A, Weigel R, Kölpin A Conference contribution, Conference Contribution Efficient radar front-end implementation in LTCC multilayer cavity technology (2017) Talai A, Weigel R, Kölpin A Conference contribution, Abstract of lecture In-Line Material Characterization Sensors Operating at 10 GHz and 77 GHz (2017) Frank M, Talai A, Weigel R, Kölpin A Conference contribution, Conference Contribution A Coplanar Waveguide Resonator Based In-Line Material Characterization Sensor for Bulk and Metallized Dielectrics (2016) Talai A, Gold G, Frank M, Mann S, Weigel R, Kölpin A Journal article Broadband Characterization of Launchers and Transitions (2016) Talai A Other publication type Permittivity Reduction and Surface Modification by Porosification of LTCC (2016) Steinhäußer F, Talai A, Kölpin A, Weigel R, Bittner A, Schmid U Journal article A Grounded Coplanar Waveguide Resonator Based In-Line Material Characterization Sensor (2016) Talai A, Mann S, Weigel R, Kölpin A Conference contribution Pulse Plated Silver Metallization on Porosified Low Temperature Co-fired Ceramics for High Frequency Applications (2016) Steinhäußer F, Talai A, Sandulache G, Weigel R, Kölpin A, Hansal W, Bittner A, Schmid U Journal article