Prof. Dr. Peter Felfer

Professur für Atom Probe Tomography

Influence of Ni Solute segregation on the intrinsic growth stresses in Cu(Ni) thin films (2016) Kaub TM, Felfer P, Cairney JM, Thompson GB Journal article Linking stress-driven microstructural evolution in nanocrystalline aluminium with grain boundary doping of oxygen (2016) He MR, Samudrala SK, Kim G, Felfer P, Breen AJ, Cairney JM, Gianola DS Journal article, Original article A simple approach to atom probe sample preparation by using shadow masks (2016) Felfer P, Mccarroll I, Macauley C, Cairney JM Journal article New approaches to nanoparticle sample fabrication for atom probe tomography (2015) Felfer P, Li T, Eder K, Galinski H, Magyar AP, Bell DC, Smith GDW, et al. Conference contribution Mapping interfacial excess in atom probe data (2015) Felfer P, Scherrer B, Demeulemeester J, Vandervorst W, Cairney JM Conference contribution The Hidden Pathways in Dense Energy Materials - Oxygen at Defects in Nanocrystalline Metals (2015) Scherrer B, Doebeli M, Felfer P, Spolenak R, Cairney J, Galinski H Journal article Detecting and extracting clusters in atom probe data: A simple, automated method using Voronoi cells (2015) Felfer P, Ceguerra AV, Ringer SP, Cairney JM Journal article Atom probe microscopy of oxidation products (2015) McCarroll I, La Fontaine A, Felfer P, Zhang J, Young D, Cairney J Conference contribution Atom probe study of chromium oxide spinels formed during intergranular corrosion (2015) La Fontaine A, Yen HW, Felfer P, Ringer SP, Cairney JM Journal article, Review article Mining information from atom probe data (2015) Cairney JM, Rajan K, Haley D, Gault B, Bagot PJ, Choi PP, Felfer P, et al. Journal article, Original article