Prof. Dr. Peter Felfer

Professur für Atom Probe Tomography

A New Approach to Understand the Adsorption of Thiophene on Different Surfaces: An Atom Probe Investigation of Self-Assembled Monolayers (2017) Eder K, Felfer P, Gault B, Ceguerra AV, La Fontaine A, Masters AF, Maschmeyer T, Cairney JM Journal article Morphology evolution of Ti3AlC carbide precipitates in high Nb containing TiAl alloys (2017) Wang L, Zenk C, Stark A, Felfer P, Gabrisch H, Göken M, Lorenz U, Pyczak F Journal article A computational geometry framework for the optimisation of atom probe reconstructions (2016) Felfer P, Cairney J Journal article Grain size stability in Al-Sc alloys processed by severe plastic deformation (2016) Eder K, Felfer P, Ferry M, Xia K, Cairney JM Journal article Contributions to understanding catalysis by using atom probe tomography (2016) Cairney J, Eder K, Felfer P, Masters A Conference contribution Influence of Ni Solute segregation on the intrinsic growth stresses in Cu(Ni) thin films (2016) Kaub TM, Felfer P, Cairney JM, Thompson GB Journal article Linking stress-driven microstructural evolution in nanocrystalline aluminium with grain boundary doping of oxygen (2016) He MR, Samudrala SK, Kim G, Felfer P, Breen AJ, Cairney JM, Gianola DS Journal article, Original article A simple approach to atom probe sample preparation by using shadow masks (2016) Felfer P, Mccarroll I, Macauley C, Cairney JM Journal article New approaches to nanoparticle sample fabrication for atom probe tomography (2015) Felfer P, Li T, Eder K, Galinski H, Magyar AP, Bell DC, Smith GDW, et al. Conference contribution Mapping interfacial excess in atom probe data (2015) Felfer P, Scherrer B, Demeulemeester J, Vandervorst W, Cairney JM Conference contribution