Prof. Dr.-Ing. Peter Wellmann

Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)

Tuning the Properties of CZTS Films by Controlling the Process Parameters in Cost-Effective Non-vacuum Technique (2018) Abdelhaleem S, Hassanien A, Ahmad R, Schuster M, Ashour A, Distaso M, Peukert W, Wellmann P Journal article, Original article Review of SiC crystal growth technology (2018) Wellmann P Journal article, Review article In situ X-ray monitoring of transport and chemistry of Ga-containing intermediates under ammonothermal growth conditions of GaN (2018) Schimmel S, Duchstein P, Steigerwald T, Kimmel AC, Schlücker E, Zahn D, Niewa R, Wellmann P Journal article, Original article Growth conditions and in situ computed tomography analysis of facetted bulk growth of SiC boules (2018) Arzig M, Salamon M, Uhlmann N, Johansen BA, Wellmann P Journal article, Original article Solution Growth of Silicon Carbide Using the Vertical Bridgman Method (2018) Fahlbusch L, Wellmann P Journal article, Original article From thin film to bulk 3C-SiC growth: Understanding the mechanism of defects reduction (2018) La Via F, Severino A, Anzalone R, Bongiorno C, Litrico G, Mauceri M, Schöler M, et al. Journal article, Original article Processing and Characterization of Vacuum-Free CuInSe2 Thin Films from Nanoparticle-Precursors using Novel Temperature Treatment Techniques (2018) Schuster M, Sisterhenn P, Graf L, Wellmann P Journal article, Original article Tuning Electrical and Optical Properties of Transparent Conductive Thin Films Using ITO and ZnO Nanoparticles, Sol-Gel-ZnO and Ag Nanowires (2017) Schuster M, Groß S, Roider F, Maksimenko I, Wellmann P Journal article, Original article Materials-Related Solutions for Industry (2017) Wellmann P Book chapter / Article in edited volumes Investigation of deep electronic levels in n‐type and p‐type 3C‐SiC using photoluminescence (2017) Wilhelm M, Syväjärvi M, Wellmann P Journal article, Original article