Prof. Dr.-Ing. Peter Wellmann

Professur für Werkstoffwissenschaften (Werkstoffe der Elektrotechnik)

Effect of Fast Annealing on Structural Characteristics and Optical Properties of Cu2ZnSnS4 Absorber Films Deposited by Doctor-Blade Technique (2019) Hassanien AE, Abdelhaleem S, Ahmad R, Schuster M, Moustafa SH, Distaso M, Peukert W, Wellmann P Journal article Impacts of carrier capture processes in the thermal quenching of photoluminescence in Al–N co-doped SiC (2019) Tarekegne AT, Norrman K, Jokubavicius V, Syväjärvi M, Schuh P, Wellmann P, Ou H Journal article Investigation of the growth kinetics of SiC crystals during physical vapor transport growth by the application of in-situ 3D computed tomography visualization (2019) Arzig M, Salamon M, Uhlmann N, Wellmann P Journal article Influence of morphological changes in a source material on the growth interface of 4H-SiC single crystals (2019) Arzig M, Steiner J, Salamon M, Uhlmann N, Wellmann P Journal article Annealing-induced changes in the nature of point defects in sublimation-grown cubic silicon carbide (2019) Schöler M, Brecht C, Wellmann P Journal article Vacuum-Free and Highly Dense Nanoparticle Based Low-Band-Gap CuInSe2 Thin-Films Manufactured by Face-to-Face Annealing with Application of Uniaxial Mechanical Pressure (2019) Schuster M, Stapf D, Osterrieder T, Barthel V, Wellmann P Journal article, Original article Limitations during Vapor Phase Growth of Bulk (100) 3C-SiC Using 3C-SiC-on-SiC Seeding Stacks (2019) Schuh P, Steiner J, La Via F, Mauceri M, Zielinski M, Wellmann P Journal article, Original article Modeling of the PVT Growth Process of Bulk 3C-SiC - Growth Process Development and Challenge of the Right Materials Data Base (2019) Schöler M, Schuh P, Steiner J, Wellmann P Journal article, Original article Vapor Growth of 3C-SiC Using the Transition Layer of 3C-SiC on Si CVD Templates (2019) Schuh P, Künecke U, Litrico G, Mauceri M, La Via F, Monnoye S, Zielinski M, Wellmann P Journal article, Original article Three-dimensional in-situ growth surveillance of bulky SiC crystals (2019) Salamon M, Arzig M, Wellmann P, Uhlmann N Conference contribution, Original article