European XFEL GmbH

Industry / private company


Location: Schenefeld, Germany (DE) DE

ISNI: 0000000405902900

ROR: https://ror.org/01wp2jz98

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

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Abstract

Journal

Setup for meV-resolution inelastic X-ray scattering measurements and X-ray diffraction at the Matter in Extreme Conditions endstation at the Linac Coherent Light Source (2018) Mcbride EE, White TG, Descamps A, Fletcher LB, Appel K, Condamine FP, Curry CB, et al. Journal article The Wide-Field Imager for IXO: Status and future activities (2010) Strueder L, Aschauer F, Bautz M, Bombelli L, Burrows D, Fiorini C, Fraser G, et al. Conference contribution
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