NaMLab gGmbH

Industry / private company


Location: Dresden, Germany (DE) DE


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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Stability and performance of heterogeneous anode assemblies of silicon nanowires on carbon meshes for lithium-sulfur battery applications (2015) Krause A, Brückner J, Doerfler S, Wisser FM, Althues H, Grube M, Martin JR, et al. Conference contribution, Conference Contribution Schottky barrier-based silicon nanowire pH sensor with live sensitivity control (2014) Zoergiebel FM, Pregl S, Roemhildt L, Opitz J, Weber WM, Mikolajick T, Baraban L, Cuniberti G Journal article Ionic effects on the transport characteristics of nanowire-based FETs in a liquid environment (2014) Nozaki D, Kunstmann J, Zoergiebel F, Pregl S, Baraban L, Weber WM, Mikolajick T, Cuniberti G Journal article Parallel arrays of Schottky barrier nanowire field effect transistors: Nanoscopic effects for macroscopic current output (2013) Pregl S, Weber WM, Nozaki D, Kunstmann J, Baraban L, Opitz J, Mikolajick T, Cuniberti G Journal article Channel length dependent sensor response of Schottky-barrier FET pH sensors (2013) Pregl S, Zorgiebel F, Baraban L, Cuniberti G, Mikolajick T, Richter C, Weber W Conference contribution Silicon nanowires - A versatile technology platform (2013) Mikolajick T, Heinzig A, Trommer J, Pregl S, Grube M, Cuniberti G, Weber WM Journal article Intrinsic MOSFET leakage of high-k peripheral DRAM devices: Measurement and simulation (2012) Roll G, Jakschik S, Goldmann M, Wachowiak A, Mikolajick T, Frey L Conference contribution, Conference Contribution Ferroelectricity in simple binary ZrO 2 and HfO 2 (2012) Mueller J, Boescke TS, Schroeder U, Mueller S, Braeuhaus D, Boettger U, Frey L, Mikolajick T Journal article, Original article Analysis of the effect of germanium preamorphization on interface defects and leakage current for high-k metal-oxide-semiconductor field-effect transistor (2011) Roll G, Jakschik S, Goldbach M, Wachowiak A, Mikolajick T, Frey L Journal article, Original article Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation (2011) Roll G, Jakschik S, Burenkov A, Goldbach M, Mikolajick T, Frey L Journal article, Original article
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