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NaMLab gGmbH
Industry / private company
Location:
Dresden, Germany (DE)
Publications
(24)
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Journal article
Journal article
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Book chapter / Article in edited volumes
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Authored book
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Translation
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Thesis
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Conference contribution
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Stability and performance of heterogeneous anode assemblies of silicon nanowires on carbon meshes for lithium-sulfur battery applications (2015)
Krause A, Brückner J, Doerfler S, Wisser FM, Althues H, Grube M, Martin JR, et al.
Conference contribution, Conference Contribution
Schottky barrier-based silicon nanowire pH sensor with live sensitivity control (2014)
Zoergiebel FM, Pregl S, Roemhildt L, Opitz J, Weber WM, Mikolajick T, Baraban L, Cuniberti G
Journal article
Ionic effects on the transport characteristics of nanowire-based FETs in a liquid environment (2014)
Nozaki D, Kunstmann J, Zoergiebel F, Pregl S, Baraban L, Weber WM, Mikolajick T, Cuniberti G
Journal article
Parallel arrays of Schottky barrier nanowire field effect transistors: Nanoscopic effects for macroscopic current output (2013)
Pregl S, Weber WM, Nozaki D, Kunstmann J, Baraban L, Opitz J, Mikolajick T, Cuniberti G
Journal article
Channel length dependent sensor response of Schottky-barrier FET pH sensors (2013)
Pregl S, Zorgiebel F, Baraban L, Cuniberti G, Mikolajick T, Richter C, Weber W
Conference contribution
Silicon nanowires - A versatile technology platform (2013)
Mikolajick T, Heinzig A, Trommer J, Pregl S, Grube M, Cuniberti G, Weber WM
Journal article
Intrinsic MOSFET leakage of high-k peripheral DRAM devices: Measurement and simulation (2012)
Roll G, Jakschik S, Goldmann M, Wachowiak A, Mikolajick T, Frey L
Conference contribution, Conference Contribution
Ferroelectricity in simple binary ZrO 2 and HfO 2 (2012)
Mueller J, Boescke TS, Schroeder U, Mueller S, Braeuhaus D, Boettger U, Frey L, Mikolajick T
Journal article, Original article
Analysis of the effect of germanium preamorphization on interface defects and leakage current for high-k metal-oxide-semiconductor field-effect transistor (2011)
Roll G, Jakschik S, Goldbach M, Wachowiak A, Mikolajick T, Frey L
Journal article, Original article
Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation (2011)
Roll G, Jakschik S, Burenkov A, Goldbach M, Mikolajick T, Frey L
Journal article, Original article
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