Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)

Research facility


Location: Erlangen, Germany (DE) DE

ISNI: 0000000104810543

ROR: https://ror.org/04q5rka56

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

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Abstract

Journal

Microstructure and Mechanical Properties of Hypereutectic Al-High Si Alloys up to 70 wt.% Si-Content Produced from Pre-Alloyed and Blended Powder via Laser Powder Bed Fusion (2023) Risse JH, Trempa M, Huber F, Höppel HW, Bartels D, Schmidt M, Reimann C, Friedrich J Journal article Scalable Quantum Memory Nodes using nuclear spins in Silicon Carbide (2023) Parthasarathy SK, Kallinger B, Kaiser F, Berwian P, Dasari D, Friedrich J, Nagy R Conference contribution 4H-SiC PIN Photodiode for VUV Detection Using an Enhanced Emitter Doping Design (2023) Schraml M, Papathanasiou N, May A, Rommel M, Erlbacher T Conference contribution Device Providing DC Short-Circuit Current (2023) Gehring J, Schwanninger R, Kaiser J, Wunder B, März M Conference contribution Analytical Loss Model of a Three-Level WBG NPC Inverter Comprising Reverse Conduction, Dead Time, Modulation Schemes and Switching Energy Analysis (2023) Quergfelder S, Heckel T, März M Conference contribution Influence of SiC chip thickness on the power cycling capability of power electronics assemblies – A comprehensive numerical study (2023) Zhao D, Letz S, Leib J, Schletz A Journal article Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials (2023) Schwarz J, Niebauer M, Kolesnik-Gray M, Szabo M, Baier L, Chava P, Erbe A, et al. Journal article Towards SiC-Based VUV Pin-Photodiodes - Investigations on 4H-SiC Photodiodes with Shallow Implanted Al Emitters (2023) Schraml M, Papathanasiou N, May A, Weiss T, Erlbacher T Book chapter / Article in edited volumes The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability (2023) Schlichting H, Lim M, Becker T, Kallinger B, Erlbacher T Book chapter / Article in edited volumes Optimization over decision trees: a case study for the design of stable direct-current electricity networks (2023) Gutina D, Bärmann A, Roeder G, Schellenberger M, Liers-Bergmann F Journal article
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