Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)

Research facility


Location: Erlangen, Germany (DE) DE

ISNI: 0000000104810543

ROR: https://ror.org/04q5rka56

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Investigation of CMOS Single Process Steps on 4H-SiC a-Plane Wafers for Quantum Applications (2024) Schwarberg J, Karhu R, Kallinger B, Rommel M, Schmidt R, Schulze J Conference contribution Modified Approach for the Rainflow Counting Analysis of Temperature Load Signals in Power Electronics Modules (2024) Letz S, März M, Zhao D Conference contribution Challenges of Junction Temperature Calibration of SiC MOSFETs for Power Cycling - a Dynamic Approach (2024) Breuer J, Dresel F, Leib J, März M, Schletz A Conference contribution Milliseconds Power Cycling (PCmsec) driving bipolar degradation in Silicon Carbide Power Devices (2024) Laha S, Leib J, Schletz A, März M, Liguda C, Faisal F, Momeni D Conference contribution Wide Bandwidth PCB Rogowski Coil Current Sensor with Droop Suppression and DC Restoration for In-Situ Inverter Measurements (2024) Quergfelder S, Sax J, Heckel T, Eckardt B, März M Conference contribution, Conference Contribution Imaging effects of particles on the surface of EUV mask and wafer (2024) Semaan R, Bottiglieri G, Erdmann A, Rispens G, de Winter L, Beekmans S Conference contribution Increasing 4H-SiC Trench Depth by Improving the Dry Etch Selectivity towards the Oxide Hard Mask (2024) Rusch O, Brueckner K, Erlbacher T Book chapter / Article in edited volumes A 4H-SiC CMOS Technology enabling Smart Sensor Integration and Circuit Operation above 500 °C (2024) May A, Rommel M, Baier L, Schraml M, Dick J, Jank M, Schulze J Conference contribution Unconventional conductivity increase in multilayer black phosphorus (2023) Kolesnik-Gray M, Meingast L, Siebert M, Unbehaun T, Huf T, Ellrott G, Abellan Saez G, et al. Journal article Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy (Scientific Reports, (2020), 10, 1, (13676), 10.1038/s41598-020-70580-3) (2023) Hutzler A, Fritsch B, Matthus CD, Jank MP, Rommel M Journal article, Erratum
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