Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)

Research facility


Location: Erlangen, Germany (DE) DE

ISNI: 0000000104810543

ROR: https://ror.org/04q5rka56

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

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To

Abstract

Journal

Alloying of ohmic contacts to n-type 4H-SiC via laser irradiation (2013) Hürner A, Schlegl T, Adelmann B, Mitlehner H, Hellmann R, Bauer A, Frey L Authored book, Volume of book series Doping induced lattice misfit in 4H-SiC homoepitaxy (2012) Kallinger B, Berwian P, Friedrich J, Mueller G, Weber AD, Volz E, Trachta G, et al. Journal article Resonant metamaterials for contrast enhancement in optical lithography (2012) Dobmann S, Shyroki D, Banzer P, Erdmann A, Peschel U Journal article Solid-phase epitaxy of silicon amorphized by implantation of the alkali elements rubidium and cesium (2012) Maier R, Haeublein V, Ryssel H, Völlm H, Feili D, Seidel H, Frey L Conference contribution, Conference Contribution Novel cost-efficient contactless distributed monitoring concept for smart battery cells (2012) Lorentz V, Wenger M, Grosch J, Giegerich M, Jank M, März M, Frey L Conference contribution, Conference Contribution Modular inverter power electronic for intelligent e-drives (2012) Hofmann M, Schletz A, Domes K, März M, Frey L Conference contribution, Conference Contribution Amplitude modulated resonant push-pull driver for piezoelectric transformers in switching power applications (2012) Schwarzmann H, Erlbacher T, Bauer A, Ryssel H, Frey L Conference contribution, Conference Contribution Improving module performance and reliability in power electronic applications by monolithic integration of RC-snubbers (2012) Erlbacher T, Schwarzmann H, Bauer AJ, Berberich SE, vom Dorp J, Frey L Conference contribution, Conference Contribution Characterization of grain boundaries in multicrystalline silicon with high lateral resolution using conductive atomic force microscopy (2012) Rumler M, Rommel M, Erlekampf J, Azizi M, Geiger T, Bauer AJ, Meissner E, Frey L Journal article, Original article Structural and reliability analysis of ohmic contacts to SiC with a stable protective coating for harsh environment applications (2012) Daves W, Krauß A, Häublein V, Bauer A, Frey L Journal article, Original article
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