Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)

Research facility


Location: Erlangen, Germany (DE) DE

ISNI: 0000000104810543

ROR: https://ror.org/04q5rka56

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

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To

Abstract

Journal

Thickness mapping of high-κ dielectrics at the nanoscale (2014) Frey L, Trapnauskas J, Rommel M, Bauer AJ, Frey L Journal article, Original article Systematic analysis of the high-and low-field channel mobility in lateral 4H-SiC MOSFETs (2014) Strenger C, Uhnevionak V, Mortet V, Ortiz G, Erlbacher T, Burenkov A, Bauer A, et al. Conference contribution, Conference Contribution Investigation of trenched and high temperature annealed 4H-SiC (2014) Banzhaf C, Grieb M, Trautmann A, Bauer A, Frey L Authored book, Volume of book series DLTS characterization of proton-implanted silicon under varying annealing conditions (2014) Laven JG, Jelinek M, Job R, Schustereder W, Schulze HJ, Rommel M, Frey L Journal article, Original article Comparative study of the luminescence of Al2O3:C and Al2O3 crystals under synchrotron radiation excitation (2013) Zorenko Y, Fabisiak K, Zorenko T, Mandowski A, Xia Q, Batentschuk M, Friedrich J, Zhusupkalieva G Journal article, Original article Isolated high voltage DC/DC converter for auxiliary power supply in commercial vehicles (2013) Seliger B, Popov J, Eckardt B, März M Conference contribution Schnelle großflächige Metall-Halbleiter-Metall Photodetektoren für Bitraten bis zu 40 Gbit/s über Ø 1 mm optische Polymerfasern (2013) Loquai S, Winkler F, Wabra S, Schmauß B, Hartl E, Ziemann O, Weinert B, et al. Conference contribution Characterization of ZnO structures by optical and X-ray methods (2013) Petrik P, Pollakowski B, Zakel S, Gumprecht T, Beckhoff B, Lemberger M, Labadi Z, et al. Journal article Bimodal CAFM TDDB distributions in polycrystalline HfO2 gate stacks: The role of the interfacial layer and grain boundaries (2013) Iglesias V, Martin-Martinez J, Porti M, Rodriguez R, Nafria M, Aymerich X, Erlbacher T, et al. Journal article, Original article Processing of silicon nanostructures by Ga+ resistless lithography and reactive ion etching (2013) Rommel M, Rumler M, Haas A, Bauer AJ, Frey L Journal article, Original article
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