Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)

Research facility


Location: Erlangen, Germany (DE) DE

ISNI: 0000000104810543

ROR: https://ror.org/04q5rka56

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Temperature dependent characterization of bipolar injection field- effect-transistors (BiFET) for determining the short-circuit-capability (2015) Hürner A, Erlbacher T, Mitlehner H, Bauer A, Frey L Authored book, Volume of book series Silicon nitride, a high potential dielectric for 600 v integrated RC-snubber applications (2015) Krach F, Schwarzmann H, Bauer A, Erlbacher T, Frey L Journal article, Original article Tailoring the Electrical Properties of HfO2 MOS-Devices by Aluminum Doping (2015) Paskaleva A, Rommel M, Hutzler A, Spassov D, Bauer A Journal article, Original article Influence of annealing, oxidation and doping on conduction-band near interface traps in 4H-SiC characterized by low temperature conductance measurements (2015) Noll S, Rambach M, Grieb M, Scholten D, Bauer A, Frey L Authored book, Volume of book series Modeling of ion drift in 4H-SiC-based chemical MOSFET sensors (2015) Erlbacher T, Schwarzmann H, Bauer AJ, Doehler GH, Schreivogel M, Lutz T, Guillen FH, et al. Journal article Comparison of silicon and 4H silicon carbide patterning using focused ion beams (2015) Kaliya Perumal Veerapandian S, Beuer S, Rumler M, Stumpf F, Thomas K, Pillatsch L, Michler J, et al. Journal article Inverter Technology for High-Speed Drives Like Electric Turbochargers (2015) Hofmann M, Eckardt B, Heckel T Conference contribution High Power Density Automotive Converters using SiC or GaN Power Devices (2015) Eckardt B, Heckel T Conference contribution, Conference Contribution Impact of post-trench processing on the electrical characteristics of 4H-SiC trench-MOS structures with thick top and bottom oxides (2015) Banzhaf C, Grieb M, Rambach M, Bauer A, Frey L Authored book, Volume of book series Improved electrical behavior of ZrO2-based MIM structures by optimizing the O3 oxidation pulse time (2015) Paskaleva A, Weinreich W, Bauer A, Lemberger M, Frey L Journal article, Original article