Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)

Research facility


Location: Erlangen, Germany (DE) DE

ISNI: 0000000104810543

ROR: https://ror.org/04q5rka56

Show on Map:

close-button

Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Methodical Identification and Evaluation of Critical Failures in DC Hybrid Switchgear (2025) Streck M, Gehring J, Bernhardt A, Fauth B, Gerke S, Hoyer C, Kaiser J, et al. Conference contribution Performance Investigation of 4H-SiC PIN Photodiodes With Dual Emitter Designs for Enhanced UV-C Detection (2025) Schraml MW, Rommel M, Papathanasiou N, May A, Erlbacher T, Schulze J Journal article Impact of Inhomogeneous Offcut Angles of GaN Native Substrates on Lateral Current Modulation in AlGaN Barrier Layers (2025) Faraji S, Meißner E, Besendörfer S, Miersch C, Weingärtner R, Beyer FC, Friedrich J Journal article Method for Detection and Limitation of Short-Circuit Currents for Semiconductor Circuit Breakers in LVDC Grids Using a Pre-Saturated Inductor (2025) Gehring J, Schwanninger R, Nowak A, Wunder B, Lorentz V, März M Journal article Self-organised ordering of scandium into basal monolayers of aluminium nitride and its implication for the growth of well-crystallized (Al,Sc)N materials for electronic devices (2025) Bläß U, Wu M, Epelbaum B, Meißner E Journal article Reinforcement Learning Strategies for Parameter Design of Bidirectional Cllc Resonant Converters With Ultrawide Voltage Range (2024) Yang X, Kruse G, Schwanninger R, Coelho R, Wunder B, Rosskopf A, Lorentz V, März M Conference contribution Utilizing Island Growth in Superlattice Buffers for the Realization of Thick GaN-on-Si(111) PIN-Structures for Power Electronics (2024) Michler S, Thapa S, Besendörfer S, Albrecht M, Weingärtner R, Meissner E Journal article Dynamic Calibration of Junction Temeperature of SiC MOSFETs for Power Cycling (2024) Breuer J, Dresel F, Schletz A, Popp J, Eckardt B, März M Conference contribution Novel Device for Fast Detection and Limitation of Short-Circuit Currents in LVDC Grids (2024) Gehring J, Wunder B, Schwanninger R, März M, Lorentz VRH Conference contribution, Original article Modelling-Augmented Failure Diagnostics in Planar SiC MOS Devices Using TDDB Measurements (2024) Cornigli D, Schlichting H, Becker T, Larcher L, Erlbacher T, Pešić M Journal article
‹ 1 2 3 4 5 ... 51 ›