Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)
Research facility
Location:
Erlangen,
Germany (DE)
ISNI: 0000000104810543
ROR: https://ror.org/04q5rka56
Energy-Equivalent Inductance Measurement System (2023)
Gehring J, Nowak A, Schwanninger R, Wunder B, März M
Conference contribution
Microstructure and Mechanical Properties of Hypereutectic Al-High Si Alloys up to 70 wt.% Si-Content Produced from Pre-Alloyed and Blended Powder via Laser Powder Bed Fusion (2023)
Risse JH, Trempa M, Huber F, Höppel HW, Bartels D, Schmidt M, Reimann C, Friedrich J
Journal article
Adjustable Current Limiting Function with a Monolithically Integrated SiC Circuit Breaker Device (2023)
Böttcher N, Takamori T, Wada K, Erlbacher T, Saito W, Nishizawa SI
Journal article, Original article
Scalable Quantum Memory Nodes using nuclear spins in Silicon Carbide (2023)
Parthasarathy SK, Kallinger B, Kaiser F, Berwian P, Dasari D, Friedrich J, Nagy R
Conference contribution
4H-SiC PIN Photodiode for VUV Detection Using an Enhanced Emitter Doping Design (2023)
Schraml M, Papathanasiou N, May A, Rommel M, Erlbacher T
Conference contribution
Device Providing DC Short-Circuit Current (2023)
Gehring J, Schwanninger R, Kaiser J, Wunder B, März M
Conference contribution
Analytical Loss Model of a Three-Level WBG NPC Inverter Comprising Reverse Conduction, Dead Time, Modulation Schemes and Switching Energy Analysis (2023)
Quergfelder S, Heckel T, März M
Conference contribution
Influence of SiC chip thickness on the power cycling capability of power electronics assemblies – A comprehensive numerical study (2023)
Zhao D, Letz S, Leib J, Schletz A
Journal article
Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials (2023)
Schwarz J, Niebauer M, Kolesnik-Gray M, Szabo M, Baier L, Chava P, Erbe A, et al.
Journal article
Towards SiC-Based VUV Pin-Photodiodes - Investigations on 4H-SiC Photodiodes with Shallow Implanted Al Emitters (2023)
Schraml M, Papathanasiou N, May A, Weiss T, Erlbacher T
Book chapter / Article in edited volumes