Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik (FBH)

Research facility


Location: Berlin, Germany (DE) DE

ISNI: 0000000107654240

ROR: https://ror.org/02be22443

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

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Journal

Erratum to "advanced thin film technology for ultrahigh resolution X-ray microscopy" [Ultramicroscopy 109 (2009) 1360-1364] (DOI:10.1016/j.ultramic.2009.07.005) (2010) Vila-Comamala J, Jefimovs K, Raabe J, Pilvi T, Fink R, Senoner M, Maassdorf A, et al. Journal article, Erratum Determination of dislocation density in GaN layers using KOH defect MOVPE grown etching (2008) Wellmann P, Sakwe A, Oehlschläger F, Hoffmann V, Zeimer U, Knauer A Journal article
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