Wacker Schott Solar GmbH

Industry / private company


Location: Alzenau, Germany (DE) DE

ISNI: 0000000406433544

ROR: https://ror.org/000q08p21

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Dopant mapping in highly p-doped silicon by micro-Raman spectroscopy at various injection levels (2013) Kunz T, Hessmann MT, Seren S, Meidel B, Terheiden B, Brabec C Journal article, Original article Laser process for extended silicon thin film solar cells (2011) Hessmann MT, Kunz T, Burkert I, Gawehns N, Schaefer L, Frick T, Schmidt M, et al. Journal article, Original article Micro-Raman mapping on layers for crystalline silicon thin-film solar cells (2011) Kunz T, Hessmann MT, Meidel B, Brabec C Journal article, Original article