Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren (IZFP) / Fraunhofer Institute for Nondestructive Testing

Research facility


Location: Saarbrücken, Germany (DE) DE

ISNI: 0000000090426291

ROR: https://ror.org/03wq67h32

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

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To

Abstract

Journal

Raspberry-like supraparticles from nanoparticle building-blocks as code-objects for hidden signatures readable by terahertz rays (2018) Stumm C, Szielasko K, Granath T, Stauch C, Mandel K Journal article Fingerprint signatures based on nanomagnets as markers in materials for tracing and counterfeit protection (2016) Szielasko K, Youssef A, Sporn D, Mandel K Journal article Automated segmentation of ultrasonic volumetric data of composite materials (2015) Osman A, Hassler U, Kaftandjian V, Hornegger J Journal article Effect of waveform of ac voltage on the morphology and crystallinity of electrochemically assembled platinum nanowires (2014) Nerowski A, Poetschke M, Wiesenhuetter U, Nicolai J, Cikalova U, Dianat A, Erbe A, et al. Journal article Schottky barrier-based silicon nanowire pH sensor with live sensitivity control (2014) Zoergiebel FM, Pregl S, Roemhildt L, Opitz J, Weber WM, Mikolajick T, Baraban L, Cuniberti G Journal article Parallel arrays of Schottky barrier nanowire field effect transistors: Nanoscopic effects for macroscopic current output (2013) Pregl S, Weber WM, Nozaki D, Kunstmann J, Baraban L, Opitz J, Mikolajick T, Cuniberti G Journal article Setup of an electron probe micro analyzer for highest resolution radioscopy (2009) Hanke R, Nachtrab F, Burtzlaff S, Voland V, Uhlmann N, Porsch F, Johansson W Journal article Comparison of different methods for determining the size of a focal spot of microfocus X-ray tubes (2008) Salamon M, Hanke R, Krueger P, Sukowski F, Uhlmann N, Voland V Journal article Realization of a computed tomography setup to achieve resolutions below 1μm (2008) Salamon M, Hanke R, Krueger P, Uhlmann N, Voland V Journal article