Institute Materials for Electronics and Energy Technology (i-MEET) (i-MEET)

Structural fluctuations cause spin-split states in tetragonal (CH₃NH₃)PbI₃ as evidenced by the circular photogalvanic effect (2018) Niesner D, Hauck M, Shrestha S, Levchuk I, Matt G, Osvet A, Batentschuk M, et al. Journal article, Original article Designing ternary blend all-polymer solar cells with an efficiency of over 10% and a fill factor of 78% (2018) Li Z, Ying L, Xie R, Zhu P, Li N, Zhong W, Huang F, Cao Y Journal article Review of SiC crystal growth technology (2018) Wellmann P Journal article, Review article Time-Resolved Analysis of Dielectric Mirrors for Vapor Sensing (2018) Gao S, Tang X, Langner S, Osvet A, Harreiß C, Barr M, Spiecker E, et al. Journal article, Original article Non-destructive imaging of defects in Ag-sinter die attach layers – A comparative study including X-ray, Scanning Acoustic Microscopy and Thermography (2018) Dreher P, Schmidt R, Vetter A, Hepp J, Karl A, Brabec C Journal article, Original article A Shape-Induced Orientation Phase within 3D Nanocrystal Solids (2018) Burian M, Karner C, Yarema M, Heiß W, Amenitsch H, Dellago C, Lechner RT Journal article, Original article Intrinsically Activated SrTiO3: Photocatalytic H2 Evolution from Neutral Aqueous Methanol Solution in the Absence of Any Noble Metal Cocatalyst (2018) Zhou X, Liu N, Yokosawa T, Osvet A, Miehlich M, Meyer K, Spiecker E, Schmuki P Journal article, Original article Suppressing the Surface Recombination and Tuning the Open-Circuit Voltage of Polymer/Fullerene Solar Cells by Implementing an Aggregative Ternary Compound (2018) Galli D, Gasparini N, Forster M, Eckert A, Widling C, Killian M, Avgeropoulos A, et al. Journal article, Original article Enhancement of accuracy of neutron atomic resolution holography (2018) Kanazawa Y, Fukumoto Y, Uechi S, Ohoyama K, Lederer M, Happo N, Hayashi K, et al. Conference contribution Local structure observation of Sm doped RB6 (R: rare earth)by white neutron atomic resolution holography (2018) Uechi S, Kanazawa Y, Fukumoto Y, Ohoyama K, Lederer M, Happo N, Hayashi K, et al. Conference contribution