Institute Materials for Electronics and Energy Technology (i-MEET) (i-MEET)

Managing Phase Orientation and Crystallinity of Printed Dion-Jacobson 2D Perovskite Layers via Controlling Crystallization Kinetics (2022) Chen Y, Hu J, Xu Z, Jiang Z, Chen S, Xu B, Xiao X, et al. Journal article Overcoming Temperature-Induced Degradation of Silver Nanowire Electrodes by an Ag@SnOx Core-Shell Approach (2022) Kalancha V, These A, Vogl L, Levchuk I, Zhou X, Barr M, Bruns M, et al. Journal article Single-Walled Carbon Nanotubes as an Additive in Organic Photovoltaics: Effects on Carrier Generation and Recombination Dynamics (2022) Abudulimu A, Eckstein K, El Gemayel M, Namal I, Phillips AB, Ellingson RJ, Heben MJ, et al. Journal article Consensus statement: Standardized reporting of power-producing luminescent solar concentrator performance (2022) Yang C, Atwater HA, Baldo MA, Baran D, Barile CJ, Barr MC, Bates M, et al. Journal article, Editorial Quantification of Efficiency Losses Due to Mobile Ions in Perovskite Solar Cells via Fast Hysteresis Measurements (2022) Le Corre VM, Diekmann J, Peña‐Camargo F, Thiesbrummel J, Tokmoldin N, Gutierrez-Partida E, Peters KP, et al. Journal article Intercalating-Organic-Cation-Induced Stability Bowing in Quasi-2D Metal-Halide Perovskites (2022) Zhang J, Langner S, Wu J, Kupfer C, Lüer L, Meng W, Zhao B, et al. Journal article Lithium-Directed Transformation of Amorphous Iridium (Oxy)hydroxides To Produce Active Water Oxidation Catalysts (2022) Esquius JR, Morgan DJ, Siller GA, Gianolio D, Aramini M, Lahn L, Kasian O, et al. Journal article Large Area Growth of Cubic Silicon Carbide Using Close Space PVT by Application of Homoepitaxial Seeding (2022) Kollmuß M, Schöler M, Anzalone R, Mauceri M, La Via F, Wellmann P Conference contribution In Situ Monitoring of Unintentionally Released Nitrogen Gas in the Initial PVT Silicon Carbide Growth Process Using Mass Spectrometry (2022) Ihle J, Wellmann P Conference contribution Applicability of a Flat-Bed Birefringence Setup for the Determination of Threading Dislocations of Silicon Carbide Wafers (2022) Steiner J, Nguyen BD, Roder M, Danilewsky A, Sandfeld S, Wellmann P Conference contribution