Department Elektrotechnik-Elektronik-Informationstechnik (EEI)

Messtechnische Erfassung und Modellierung der Hysterese ferroelektrischer Werkstoffe (2010) Wolf F, Sutor A, Rupitsch S, Lerch R Conference contribution UWB SLAM with Rao-Blackwellized Monte Carlo Data Association (2010) Deißler T, Thielecke J Conference contribution Standardized Characterisation of Device Power Supplies for Automated Test Generation and Simulation (2010) Glaser D, Müller A, Lu P, Uygur G, Helmreich K Conference contribution Topography-aware BARC optimization for double patterning (2010) Jahn J, Erdmann A, Fühner T, Liu S, Shao F, Barenbaum A Conference contribution, Original article TRINICON for Dereverberation of Speech and Audio Signals (2010) Buchner H, Kellermann W Book chapter / Article in edited volumes NMOS logic circuits using 4H-SiC MOSFETs for high temperature applications (2010) Le-Huu M, Schrey F, Grieb M, Schmitt H, Haeublein V, Bauer A, Ryssel H, Frey L Authored book, Volume of book series Honeycomb voids due to ion implantation in germanium (2010) Kaiser RJ, Koffel S, Pichler P, Bauer AJ, Amon B, Claverie A, Benassayag G, et al. Journal article, Original article Future challenges in CMOS process modeling (2010) Pichler P, Burenkov A, Lorenz J, Kampen C, Frey L Journal article, Original article An UHF RFID Reader for Cell Phones (2010) Löffler A Conference contribution Analysis of the applicability of RFID & wireless sensors to manufacturing and distribution lines trough a testing multi-platform (2010) Löffler A, Wissendheit U Conference contribution