Department Elektrotechnik-Elektronik-Informationstechnik (EEI)

Improved characterization of the magnetic properties of hexagonally packed wires (2011) Roßmanith H, Albach M, Fischer J, Stadler A Journal article, Original article New laboratory for over-the-air testing and wave field synthesis (2011) Heuberger A Conference contribution Gate oxide reliability at the nanoscale evaluated by combining conductive atomic force microscopy and constant voltage stress (2011) Erlbacher T, Yanev VC, Rommel M, Bauer A, Frey L Journal article Dopant profiles in silicon created by MeV hydrogen implantation: Influence of annealing parameters (2011) Laven J, Hans Joachim S, Häublein V, Niedernostheide FJ, Ryssel H, Frey L Journal article Properties of SiO2 and Si3 N4 as gate dielectrics for printed ZnO transistors (2011) Walther S, Polster S, Meyer B, Jank MPM, Ryssel H, Frey L Journal article, Original article Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy (2011) Jambreck JD, Yanev V, Schmitt H, Rommel M, Bauer AJ, Frey L Journal article, Original article Leakage current and defect characterization of p+n-source/drain diodes (2011) Roll G, Goldbach M, Frey L Journal article, Original article Investigation of the reliability of 4H-SiC MOS devices for high temperature applications (2011) Le-Huu M, Schmitt H, Noll S, Grieb M, Schrey FF, Bauer AJ, Frey L, Ryssel H Journal article, Original article Influence of annealing parameters on surface roughness, mobility, and contact resistance of aluminium implanted 4H SiC (2011) Schmitt H, Haeublein V, Bauer A, Frey L Authored book, Volume of book series Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation (2011) Roll G, Jakschik S, Burenkov A, Goldbach M, Mikolajick T, Frey L Journal article, Original article