Professur für Physikalische Chemie

Erratum to "advanced thin film technology for ultrahigh resolution X-ray microscopy" [Ultramicroscopy 109 (2009) 1360-1364] (DOI:10.1016/j.ultramic.2009.07.005) (2010) Vila-Comamala J, Jefimovs K, Raabe J, Pilvi T, Fink R, Senoner M, Maassdorf A, et al. Journal article, Erratum Disordering of an organic overlayer on a metal surface upon cooling (2010) Schoell A, Kilian L, Zou Y, Ziroff J, Hame S, Reinert F, Umbach E, Fink R Journal article, Original article Assignment of near-edge x-ray absorption fine structure spectra of metalloporphyrins by means of time-dependent density-functional calculations (2010) Schmidt NA, Fink R, Hieringer W Journal article, Original article In situ STXM investigations of pentacene-based OFETs during operation (2010) Hub C, Burkhardt M, Halik M, Tzvetkov G, Fink R Journal article, Original article NanoXAS - The in situ combination of scanning transmission X-ray and scanning probe microscopy (2010) Wenzel S, Fink R, Raabe J, Quitmann C, Hug HJ Conference contribution, Conference Contribution Zone-plate based nanospectroscopy with soft X-rays at the SLS (2009) Fink R, Hub C, Tzvetkov G Journal article, Original article NanoXAS, a novel concept for high resolution microscopy (2009) Fink R, Raabe J, Quitmann C, Hug HJ Conference contribution, Conference Contribution Advanced thin film technology for ultrahigh resolution X-ray microscopy (2009) Fink R, Raabe J, David C Journal article, Original article Electronic relaxation effects in condensed polyacenes: A high-resolution photoemission study (2008) Rocco MLM, Haeming M, Batchelor DR, Fink R, Schoell A, Umbach E Journal article, Original article The polLux microspectroscopy beam line at the swiss light source (2007) Fink R, Raabe J, Quitmann C, Ade H Conference contribution, Conference Contribution