Lehrstuhl für Elektronische Bauelemente

Temperature analysis of the Gaussian distribution modeling the barrier height inhomogeneity in the Tungsten/4H-SiC Schottky diode (2021) Toumi S, Ouennoughi Z, Weiß R Journal article X-Ray diffraction analysis and modeling of the depth profile of lattice strains in AlGaN stacks (2021) Rafaja D, Fischer P, Barchuk M, Motylenko M, Roeder C, Besendoerfer S, Meißner E Journal article Beam-induced heating at low electron fluxes during liquid phase transmission electron microscopy (2021) Fritsch B, Hutzler A, Wu M, Vogl L, Jank MP, März M, Spiecker E Journal article, Original article Removing the orientational degeneracy of the TS defect in 4H-SiC by electric fields and strain (2021) Rühl M, Lehmeyer J, Nagy R, Weißer M, Bockstedte M, Krieger M, Weber HB Journal article, Letter Narrow inhomogeneous distribution of spin-active emitters in silicon carbide (2021) Nagy R, Dasari DBR, Babin C, Liu D, Vorobyov V, Niethammer M, Widmann M, et al. Journal article Hybrid Additive Manufacturing by Embedded Electrical Circuits Using 3-D Dispensing (2021) Schmidt K, Polzinger B, Metry M, Koppe S, Zimmermann A Journal article Evaluating local temperature changes during liquid cell transmission electron microscopy by in situ parallel beam electron diffraction (2021) Fritsch B, Hutzler A, Wu M, Vogl L, Jank MPM, März M, Spiecker E Conference contribution, Abstract of lecture Direct Manipulation of Nanostructures Utilizing Donut-Shaped Potential Wells during Liquid-Phase Transmission Electron Microscopy (2021) Hutzler A, Fritsch B, Branscheid R, Wu M, Jank M, Spiecker E Conference contribution Accessing local electron-beam induced temperature changes during in situ liquid-phase transmission electron microscopy (2021) Fritsch B, Hutzler A, Wu M, Khadivianazar S, Vogl L, Jank MPM, März M, Spiecker E Journal article, Letter From Cyclopentasilane to Thin-Film Transistors (2021) Gerwig M, Ali AS, Neubert D, Polster S, Bohme U, Franze G, Rosenkranz M, et al. Journal article, Original article