Lehrstuhl für Elektronische Bauelemente


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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

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Abstract

Journal

Fast Estimation of the Lateral Fidelity of Ion Implantation in 4H-SiC through Calibration to JFET Transfer Characteristics in TCAD (2024) Böttcher N, Sakai K, Szabo M, Beuer S, Rommel M Journal article, Report Investigation of Ohmic Contacts and Resistances of a 4H-SiC CMOS Technology up to 550◦C (2024) Böttcher N, Kauth J, Rommel M, May A, Baier L, Jank M Journal article, Original article Unconventional conductivity increase in multilayer black phosphorus (2023) Kolesnik-Gray M, Meingast L, Siebert M, Unbehaun T, Huf T, Ellrott G, Abellan Saez G, et al. Journal article Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy (Scientific Reports, (2020), 10, 1, (13676), 10.1038/s41598-020-70580-3) (2023) Hutzler A, Fritsch B, Matthus CD, Jank M, Rommel M Journal article, Erratum Operational experience with a liquid organic hydrogen carrier (LOHC) system for bidirectional storage of electrical energy over 725 h (2023) Geiling J, Wagner L, Auer F, Ortner F, Nuß A, Seyfried R, Stammberger F, et al. Journal article Stiffness influence on particle separation in polydimethylsiloxane-based deterministic lateral displacement devices (2023) Marhenke J, Dirnecker T, Vogel N, Rommel M Journal article Goethite Mineral Dissolution to Probe the Chemistry of Radiolytic Water in Liquid-Phase Transmission Electron Microscopy (2023) Couasnon T, Fritsch B, Jank M, Blukis R, Hutzler A, Benning LG Journal article Strain relaxation from annealing of SiGe heterostructures for qubits (2023) Liu Y, Gradwohl KP, Lu CH, Kaspars D, Yamamoto Y, Becker L, Storck P, et al. Journal article Gram-Scale Continuous Flow Synthesis of Silver-on-Silica Patchy Nanoparticles with Widely Tunable Resonances for Plasmonics Applications (2023) Völkl A, Toutouly J, Drobek D, Apeleo Zubiri B, Spiecker E, Klupp Taylor R Journal article, Original article The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability (2023) Schlichting H, Lim M, Becker T, Kallinger B, Erlbacher T Journal article