Lehrstuhl für Elektronische Bauelemente

Ferroelectric Content-Addressable Memory Cells with IGZO Channel: Impact of Retention Degradation on the Multibit Operation (2023) Sk MR, Thunder S, Lehninger D, Sanctis S, Raffel Y, Lederer M, Jank MPM, et al. Journal article The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability (2023) Becker T Authored book, Volume of book series Proven Power Cycling Reliability of Ohmic Annealing Free SiC Power Device Through the Use of SmartSiC™ Substrate (2023) Becker T Authored book, Volume of book series Improved Power Cycling Reliability through the use of SmartSiC ™ Engineered Substrate for Power Devices (2023) Becker T Conference contribution, Conference Contribution A Modeling of 4H-SiC Super-Junction MOSFETs with Filtered High Energy Implantation (2023) Weiße J Authored book, Volume of book series Correlation of Extended Defects with Electrical Yield of SiC MOSFET Devices (2023) Baierhofer D, Thomas B, Staiger F, Marchetti B, Förster C, Erlbacher T Journal article Effect of the Precursor Chemistry on the Crystallization of Triple Cation Mixed Halide Perovskites (2023) Singh M, Abdelsamie M, Li Q, Kodalle T, Lee DK, Arnold S, Ceratti DR, et al. Journal article Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials (2023) Schwarz J, Niebauer M, Kolesnik-Gray M, Szabo M, Baier L, Chava P, Erbe A, et al. Journal article SiGeSn/GeSn Multi Quantum Wells Light Emitting Diodes with a Negative Differential Resistance (2023) Seidel L, Liu T, Marzban B, Kiyek V, Schulze J, Capellini G, Witzens J, et al. Conference contribution Tailoring the Acidity of Liquid Media with Ionizing Radiation: Rethinking the Acid-Base Correlation beyond pH (2023) Fritsch B, Körner A, Couasnon T, Blukis R, Taherkhani M, Benning LG, Jank M, et al. Journal article