Lehrstuhl für Elektronische Bauelemente

Proven Power Cycling Reliability of Ohmic Annealing Free SiC Power Device Through the Use of SmartSiC™ Substrate (2023) Becker T Authored book, Volume of book series Improved Power Cycling Reliability through the use of SmartSiC ™ Engineered Substrate for Power Devices (2023) Becker T Conference contribution, Conference Contribution A Modeling of 4H-SiC Super-Junction MOSFETs with Filtered High Energy Implantation (2023) Weiße J Authored book, Volume of book series Correlation of Extended Defects with Electrical Yield of SiC MOSFET Devices (2023) Baierhofer D, Thomas B, Staiger F, Marchetti B, Förster C, Erlbacher T Journal article Effect of the Precursor Chemistry on the Crystallization of Triple Cation Mixed Halide Perovskites (2023) Singh M, Abdelsamie M, Li Q, Kodalle T, Lee DK, Arnold S, Ceratti DR, et al. Journal article Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials (2023) Schwarz J, Niebauer M, Kolesnik-Gray M, Szabo M, Baier L, Chava P, Erbe A, et al. Journal article SiGeSn/GeSn Multi Quantum Wells Light Emitting Diodes with a Negative Differential Resistance (2023) Seidel L, Liu T, Marzban B, Kiyek V, Schulze J, Capellini G, Witzens J, et al. Conference contribution Tailoring the Acidity of Liquid Media with Ionizing Radiation: Rethinking the Acid-Base Correlation beyond pH (2023) Fritsch B, Körner A, Couasnon T, Blukis R, Taherkhani M, Benning LG, Jank M, et al. Journal article Towards SiC-Based VUV Pin-Photodiodes - Investigations on 4H-SiC Photodiodes with Shallow Implanted Al Emitters (2023) Schraml M, Papathanasiou N, May A, Weiss T, Erlbacher T Book chapter / Article in edited volumes Systemübergreifende modulare Charakterisierung von Dünnschichtsystemen mittels Reflexionsmessungen (2023) Pham A Thesis