Lehrstuhl für Elektronische Bauelemente

SiC engineered substrate: increasing SiC MOSFETs current density from device to module level (2024) Becker T Conference contribution, Conference Contribution In situ, non-invasive novel measurement method for the determination of integrated waveguide losses (2024) Hack M, Kugler B, Wanitzek M, Vijayan P, Schulze J, Oehme M Conference contribution Pulse tunable SiGeSn/GeSn multi-quantum-well microdisk lasers (2024) Seidel L, Liu T, Concepcion O, Spirito D, Benkhelifa A, Kiyek V, Schulze J, et al. Conference contribution Reduction of dark current in Ge-on-Si avalanche photodiodes using a double mesa structure (2024) Wanitzek M, Hack M, Ramachandra H, Seidel L, Schwarz D, Schulze J, Oehme M Conference contribution Quantum enhanced electric field mapping within semiconductor devices (2024) Scheller D, Hrunski F, Schwarberg J, Knolle W, Soykal ÖO, Udvarhelyi P, Narang P, et al. Journal article, Letter Increasing 4H-SiC Trench Depth by Improving the Dry Etch Selectivity towards the Oxide Hard Mask (2024) Rusch O, Brueckner K, Erlbacher T Book chapter / Article in edited volumes A 4H-SiC CMOS Technology enabling Smart Sensor Integration and Circuit Operation above 500 °C (2024) May A, Rommel M, Baier L, Schraml M, Dick J, Jank MP, Schulze J Conference contribution Integrated Mask Process Modeling for Better Yield Predictions (2024) Awad A, Behroozi C, Erdmann A Conference contribution Fundamentals of ammonothermal growth of nitride crystals (2024) Chirala VYMR, Schimmel S Conference contribution, Abstract of a poster Unconventional conductivity increase in multilayer black phosphorus (2023) Kolesnik-Gray M, Meingast L, Siebert M, Unbehaun T, Huf T, Ellrott G, Abellan Saez G, et al. Journal article