Lehrstuhl für Elektronische Bauelemente


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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Simple and efficient method to fabricate nano cone arrays by FIB milling demonstrated on planar substrates and on protruded structures (2012) Rommel M, Bauer AJ, Frey L Journal article, Original article Nonlinear inductors for active power factor correction circuits (2012) Stadler A, Gulden C, Stolzke T Conference contribution, Conference Contribution EPR investigations of non-oxidized silicon nanoparticles from thermal pyrolysis of silane (2011) Jank M, Frey L, Peukert W, Körmer R, Wu J, Otto M Journal article Structural defects in aluminium nitride bulk crystals visualized by cathodoluminescence maps (2011) Bickermann M, Schimmel S, Epelbaum B, Filip O, Heimann P, Nagata S, Winnacker A Journal article, Original article Jet printing of colloidal solutions - Numerical modeling and experimental verification of the influence of ink and surface parameters on droplet spreading (2011) Schneider O, Epple P, Teuber E, Meyer B, Jank MPM, Rauh C, Delgado A Journal article Verbesserung der Detektion sphärischer Marker für die optische Navigationschirurgie. (2011) Garcia E, Sültrop C, Hausotte T Conference contribution, Conference Contribution Thermal characterization of an axle-twin-drive with system integrated double-inverter (2011) Hofmann M, Eckhardt B, März M, Frey L Conference contribution, Conference Contribution Monolithic RC-snubber for power electronic applications (2011) vom Dorp J, Berberich SE, Erlbacher T, Bauer A, Ryssel H, Frey L Conference contribution, Conference Contribution Light confinement by structured metal tips for antenna-based scanning near-field optical microscopy (2011) Jambreck J, Böhmler M, Rommel M, Hartschuh A, Bauer A, Frey L Conference contribution, Conference Contribution Electrical characterization of lateral 4H-SiC MOSFETs in the temperature range of 25 to 600 °C for harsh environment applications (2011) Daves W, Krauss A, Häublein V, Bauer A, Frey L Conference contribution, Conference Contribution