Lehrstuhl für Elektronische Bauelemente


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Journal article
Book chapter / Article in edited volumes
Authored book
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Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

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Abstract

Journal

Stiffness influence on particle separation in polydimethylsiloxane-based deterministic lateral displacement devices (2023) Marhenke J, Dirnecker T, Vogel N, Rommel M Journal article Goethite Mineral Dissolution to Probe the Chemistry of Radiolytic Water in Liquid-Phase Transmission Electron Microscopy (2023) Couasnon T, Fritsch B, Jank MP, Blukis R, Hutzler A, Benning LG Journal article Gram-Scale Continuous Flow Synthesis of Silver-on-Silica Patchy Nanoparticles with Widely Tunable Resonances for Plasmonics Applications (2023) Völkl A, Toutouly J, Drobek D, Apeleo Zubiri B, Spiecker E, Klupp Taylor R Journal article, Original article The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability (2023) Schlichting H, Lim M, Becker T, Kallinger B, Erlbacher T Journal article Einzelprozessentwicklung für die Herstellung von Halbleiterbauelementen auf 4H-SiC a-Plane Substraten (2023) Schmidt R Thesis Sharp MIR plasmonic modes in gratings made of heavily doped pulsed laser-melted Ge1-xSnx (2023) Berkmann F, Steuer O, Ganss F, Prucnal S, Schwarz D, Fischer IA, Schulze J Journal article Temperature Field, Flow Field, and Temporal Fluctuations Thereof in Ammonothermal Growth of Bulk GaN—Transition from Dissolution Stage to Growth Stage Conditions (2023) Schimmel S, Tomida D, Ishiguro T, Honda Y, Chichibu SF, Amano H Journal article High mobility Ge 2DHG based MODFETs for low-temperature applications (2023) Weißhaupt D, Funk HS, Oehme M, Bloos D, Berkmann F, Seidel L, Fischer IA, Schulze J Journal article Ferroelectric Content-Addressable Memory Cells with IGZO Channel: Impact of Retention Degradation on the Multibit Operation (2023) Sk MR, Thunder S, Lehninger D, Sanctis S, Raffel Y, Lederer M, Jank MPM, et al. Journal article The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability (2023) Becker T Authored book, Volume of book series