Lehrstuhl für Elektronische Bauelemente


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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

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Abstract

Journal

Nanoparticles: In Situ Liquid Cell TEM Studies on Etching and Growth Mechanisms of Gold Nanoparticles at a Solid–Liquid–Gas Interface (2019) Hutzler A, Fritsch B, Jank M, Branscheid R, Martens C, Spiecker E, März M Journal article Comprehensive accuracy examination of electrical power loss measurements of inductive components for frequencies up to 1 MHz (2019) Stolzke T, Ehrlich S, Joffe C, März M Journal article, Original article In Situ Liquid Cell TEM Studies on Etching and Growth Mechanisms of Gold Nanoparticles at a Solid-Liquid-Gas Interface (2019) Hutzler A, Fritsch B, Jank M, Branscheid R, Martens R, Spiecker E, März M Journal article, Letter Diffusion of Phosphorus and Boron from Atomic Layer Deposition Oxides into Silicon (2019) Beljakowa S, Pichler P, Kalkofen B, Hübner R Journal article On a Novel Source Technology for Deep Aluminum Diffusion for Silicon Power Electronics (2019) Rattmann G, Pichler P, Erlbacher T Journal article Deeper insight into lifetime-engineering in 4H-SiC by ion implantation (2019) Erlekampf J, Kallinger B, Weiße J, Rommel M, Berwian P, Friedrich J, Erlbacher T Journal article Design Considerations for Robust Manufacturing and High Yield of 1.2 kV 4H-SiC VDMOS Transistors (2019) Schlichting H, Sledziewski T, Bauer A, Erlbacher T Journal article Preparation of Graphene-Supported Microwell Liquid Cells for In Situ Transmission Electron Microscopy (2019) Hutzler A, Fritsch B, Jank MPM, Branscheid R, Spiecker E, März M Journal article, Original article Publisher's Note: Aluminum acceptor activation and charge compensation in implanted p-type 4H-SiC (AIP Advances (2019) 9 (055308) DOI: 10.1063/1.5096440) (2019) Weiße J, Hauck M, Krieger M, Bauer AJ, Erlbacher T Journal article, Erratum A hybrid frequency-time-domain approach to determine the vibration fatigue life of electronic devices (2019) Schriefer T, Hofmann M Journal article