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Lehrstuhl für Elektronische Bauelemente
Friedrich-Alexander-Universität Erlangen-Nürnberg
Technische Fakultät
Department Elektrotechnik-Elektronik-Informationstechnik (EEI)
Overview
Publications
(565)
Research Fields
(9)
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Journal article
Journal article
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Book chapter / Article in edited volumes
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Authored book
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Translation
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Nanoparticles: In Situ Liquid Cell TEM Studies on Etching and Growth Mechanisms of Gold Nanoparticles at a Solid–Liquid–Gas Interface (2019)
Hutzler A, Fritsch B, Jank M, Branscheid R, Martens C, Spiecker E, März M
Journal article
Comprehensive accuracy examination of electrical power loss measurements of inductive components for frequencies up to 1 MHz (2019)
Stolzke T, Ehrlich S, Joffe C, März M
Journal article, Original article
In Situ Liquid Cell TEM Studies on Etching and Growth Mechanisms of Gold Nanoparticles at a Solid-Liquid-Gas Interface (2019)
Hutzler A, Fritsch B, Jank M, Branscheid R, Martens R, Spiecker E, März M
Journal article, Letter
Diffusion of Phosphorus and Boron from Atomic Layer Deposition Oxides into Silicon (2019)
Beljakowa S, Pichler P, Kalkofen B, Hübner R
Journal article
On a Novel Source Technology for Deep Aluminum Diffusion for Silicon Power Electronics (2019)
Rattmann G, Pichler P, Erlbacher T
Journal article
Deeper insight into lifetime-engineering in 4H-SiC by ion implantation (2019)
Erlekampf J, Kallinger B, Weiße J, Rommel M, Berwian P, Friedrich J, Erlbacher T
Journal article
Design Considerations for Robust Manufacturing and High Yield of 1.2 kV 4H-SiC VDMOS Transistors (2019)
Schlichting H, Sledziewski T, Bauer A, Erlbacher T
Journal article
Preparation of Graphene-Supported Microwell Liquid Cells for In Situ Transmission Electron Microscopy (2019)
Hutzler A, Fritsch B, Jank MPM, Branscheid R, Spiecker E, März M
Journal article, Original article
Publisher's Note: Aluminum acceptor activation and charge compensation in implanted p-type 4H-SiC (AIP Advances (2019) 9 (055308) DOI: 10.1063/1.5096440) (2019)
Weiße J, Hauck M, Krieger M, Bauer AJ, Erlbacher T
Journal article, Erratum
A hybrid frequency-time-domain approach to determine the vibration fatigue life of electronic devices (2019)
Schriefer T, Hofmann M
Journal article
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