Lehrstuhl für Elektronische Bauelemente

ASNOM mapping of SiC epilayer doping profile and of surface phonon polariton waveguiding (2020) Kazantsev D, Ryssel H Journal article Vertical breakdown of GaN on Si due to V-pits (2020) Besendörfer S, Meißner E, Tajalli A, Meneghini M, Freitas JA, Derluyn J, Medjdoub F, et al. Journal article Integration of printed electronics with potted power electronic modules (2020) Zimmermann V, Zörner A, Chen W, Yu Z, Jank M, Bayer C, Schletz A, März M Conference contribution Low-resistance ohmic contact formation by laser annealing of N-implanted 4H-SiC (2020) Hellinger C, Rusch O, Rommel M, Bauer AJ, Erlbacher T Conference contribution Reducing on-resistance for SiC diodes by thin wafer and laser anneal technology (2020) Rusch O, Hellinger C, Moult J, Corcoran Y, Erlbacher T Conference contribution Impact of channel implantation on a 4h-sic cmos operational amplifier for high temperature applications (2020) Albrecht M, Pérez D, Martens R, Bauer AJ, Erlbacher T Conference contribution Influence of shallow pits and device design of 4H-SiC VDMOS transistors on in-line defect analysis by photoluminescence and differential interference contrast mapping (2020) Kocher M, Schlichting H, Kallinger B, Rommel M, Bauer AJ, Erlbacher T Conference contribution A Method for the Characterization of Adhesion Strength Degradation of Thin Films on Si-Substrate under thermal cycling test (2020) Zhao D, Letz S, Schletz A, März M Conference contribution, Conference Contribution An Iterative Surface Potential Algorithm Including Interface Traps for Compact Modeling of SiC-MOSFETs (2020) Albrecht M, Klüpfel F, Erlbacher T Journal article A 4H-SiC UV Phototransistor with Excellent Optical Gain Based on Controlled Potential Barrier (2020) Di Benedetto L, Licciardo GD, Erlbacher T, Bauer AJ, Rubino A Journal article