Lehrstuhl für Elektronische Bauelemente

Design Considerations on a Monolithically Integrated, Self Controlled and Regenerative 900 V SiC Circuit Breaker (2020) Boettcher N, Erlbacher T Conference contribution Molecular dynamics modeling of the radial heat transfer from silicon nanowires (2020) Bejenari I, Burenkov A, Pichler P, Deretzis I, La Magna A Conference contribution Reliability of silver direct bonding in thermal cycling tests (2020) Yu Z, Zeng W, Zhao D, Zhang Z, Bayer CF, Schletz A, März M Conference contribution Fully convolutional networks for void segmentation in X-ray images of solder joints (2020) Wankerl H, Stern M, Altieri-Weimar P, Al-Baddai S, Lang KJ, Roider F, Lang EW Journal article Highly Accurate Determination of Heterogeneously Stacked Van-der-Waals Materials by Optical Microspectroscopy (2020) Hutzler A, Fritsch B, Matthus C, Jank MPM, Rommel M Journal article, Original article X-ray characterization of physical-vapor-transport-grown bulk AlN single crystals (2020) Wicht T, Mueller S, Weingaertner R, Epelbaum B, Besendoerfer S, Bläß U, Weißer M, et al. Journal article RESURF n-LDMOS Transistor for Advanced Integrated Circuits in 4H-SiC (2020) Weiße J, Matthus C, Schlichting H, Mitlehner H, Erlbacher T Journal article Effect of temperature on the Fowler-Nordheim barrier height, flat band potentials and electron/hole effective masses in the MOS capacitors (2020) Toumi S, Ouennoughi Z, Murakami K Journal article Mode properties of telecom wavelength InP-based high-(Q/V) L4/3 photonic crystal cavities (2020) Rickert L, Fritsch B, Kors A, Reithmaier JP, Benyoucef M Journal article Interplay between C-doping, threading dislocations, breakdown, and leakage in GaN on Si HEMT structures (2020) Besendörfer S, Meißner E, Zweipfennig T, Yacoub H, Fahle D, Behmenburg H, Kalisch H, et al. Journal article