Lehrstuhl für Elektronische Bauelemente

Reliability of Silicon-Nitride based High-Voltage Monolithic Capacitors (2021) Becker T Other publication type, Workshop Strain-activated light-induced halide segregation in mixed-halide perovskite solids (2020) Zhao Y, Miao P, Elia J, Hu H, Wang X, Heumüller T, Hou Y, et al. Journal article In-situ preparation of gan sacrificial layers on sapphire substrate in movpe reactor for self-separation of the overgrown gan crystal (2020) Faraji S, Meißner E, Weingärtner R, Besendörfer S, Friedrich J Journal article Spin-controlled generation of indistinguishable and distinguishable photons from silicon vacancy centres in silicon carbide (2020) Morioka N, Babin C, Nagy R, Gediz I, Hesselmeier E, Liu D, Joliffe M, et al. Journal article The impact of dislocations on AlGaN/GaN Schottky diodes and on gate failure of high electron mobility transistors (2020) Besendörfer S, Meißner E, Medjdoub F, Derluyn J, Friedrich J, Erlbacher T Journal article Combined experimental and numerical approach for investigating the mechanical degradation of the interface between thin film metallization and Si-substrate after temperature cycling test (2020) Zhao D, Letz S, Yu Z, Schletz A, März M Journal article, Original article Advancing the sensitivity of integrated epoxy-based Bragg grating refractometry by high-index nanolayers (2020) Hessler S, Knopf S, Rommel M, Girschikofsky M, Schmauß B, Hellmann R Journal article Design Considerations on a Monolithically Integrated, Self Controlled and Regenerative 900 V SiC Circuit Breaker (2020) Boettcher N, Erlbacher T Conference contribution Molecular dynamics modeling of the radial heat transfer from silicon nanowires (2020) Bejenari I, Burenkov A, Pichler P, Deretzis I, La Magna A Conference contribution Reliability of silver direct bonding in thermal cycling tests (2020) Yu Z, Zeng W, Zhao D, Zhang Z, Bayer CF, Schletz A, März M Conference contribution