Lehrstuhl für Elektronische Bauelemente

Adjustable Current Limiting Function with a Monolithically Integrated SiC Circuit Breaker Device (2023) Böttcher N, Takamori T, Wada K, Erlbacher T, Saito W, Nishizawa SI Journal article, Original article Growth of 28Si Quantum Well Layers for Qubits by a Hybrid MBE/CVD Technique (2023) Liu Y, Albrecht M Journal article, Original article Strain relaxation of Si/SiGe heterostructures by a geometric Monte Carlo approach (2023) Gradwohl KP, Liu Y, Richter C, Boeck T, Martin J, Albrecht M Journal article Junior Research Group on Nitride Semiconductors (2023) Schimmel S Conference contribution, Abstract of a poster 4H-SiC PIN Photodiode for VUV Detection Using an Enhanced Emitter Doping Design (2023) Schraml M, Papathanasiou N, May A, Rommel M, Erlbacher T Conference contribution The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability (2023) Becker T Authored book, Volume of book series Proven Power Cycling Reliability of Ohmic Annealing Free SiC Power Device Through the Use of SmartSiC™ Substrate (2023) Becker T Authored book, Volume of book series Improved Power Cycling Reliability through the use of SmartSiC ™ Engineered Substrate for Power Devices (2023) Becker T Conference contribution, Conference Contribution A Modeling of 4H-SiC Super-Junction MOSFETs with Filtered High Energy Implantation (2023) Weiße J Authored book, Volume of book series Correlation of Extended Defects with Electrical Yield of SiC MOSFET Devices (2023) Baierhofer D, Thomas B, Staiger F, Marchetti B, Förster C, Erlbacher T Journal article