Engineering Reports

ISSN: 2577-8196
Publisher: Wiley

Publications (2)

X-ray microscopy and automatic detection of defects in through silicon vias in three-dimensional integrated circuits (2022) Wolz BC, Jaremenko C, Vollnhals F, Kling L, Wrege J, Christiansen S Journal article Assessment of the reliability of vanadium-redox flow batteries (2020) Reichelt F, Müller K Journal article